Analysis of surface roughness and its relationship with photoluminescence properties of silicon-rich oxide films


AU: 
Luna-Lopez, J.A.; Morales-Sanchez, A.; Aceves-Mijares, M.; Yu, Z.; Dominguez, C.
SO: 
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
GTQ Authors: 
VL: 
27
IS: 
1
BP: 
57
EP: 
62
PY: 
2009
SN: 
0734-2101
Impact: 
1.17
Year IF: 
2008
Abstract: 

It is well known that silicon-rich oxide (SRO) shows intense photoluminescence (PL). In this work, the authors studied the relationship of the surface morphology and the PL emission. PL spectra of SRO as a function of the excess silicon, temperature, and

DT: 
Article en revistes indexades
Percentil: 
LOW
Percentil Year: 
2008
Category: 
PHYSICS, APPLIED