XPS and AFM characterisation of selective monolayers for cationic detection: application to field effect chemical micro-sensors


AU: 
Rochefeuille, S.; Berjoan, R.; Seta, P.; Jiménez-Jorquera, C.; Desfours, J.P.
SO: 
CHEMICAL PHYSICS LETTERS
Autors del GTQ: 
VL: 
376
IS: 
03/04/11
BP: 
274
EP: 
281
PY: 
2003
SN: 
0009-2614
Impact: 
2.43
Any IF: 
2003
Resum: 

X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) have been used to investigate physicochemical properties of mixed Langmuir-films made of carboxylic ionophores and phospholipids. The selective monolayers were deposited onto semicon

DT: 
Article en revistes indexades
Percentil: 
HIGH
Any Percentil: 
2003
Categoria: 
PHYSICS, ATOMIC, MOLECULAR & CHEMICAL